EDN

Keithley’s software deals with growing wafer-test recipes in fabs

CLEVELAND — Keithley Instruments Inc. today introduced two new software modules for its Automated Parametric Test (APT) systems to significantly increase tester utilization by eliminating potential ...
EDN

Know your test hardware

John Slezia is a test engineer and a member of the technical staff at Cypress Semiconductor's manufacturing test group in Bloomington, MN. Cypress produces synchronous and asynchronous memories, first ...
Seeking Alpha

Aehr Test Systems and ISE Labs Announce Partnership on Wafer-Level Test and Burn-in for High-Performance Computing and Artificial Intelligence Processors

FREMONT, CA / ACCESS Newswire / November 3, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in solutions, today announced a strategic partnership with ISE Labs, ...
Semiconductor Engineering

Managing Wafer Retest

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
Nasdaq

Aehr to Showcase FOX-P™ Wafer-Level, Die and Module Test Solutions at Virtual SWTest Untethered 2020 Conference on November 11

FREMONT, Calif., Nov. 09, 2020 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, will be showcasing its FOX-P™ ...
Nasdaq

Major Silicon Carbide Semiconductor Supplier Chooses Aehr for Production Wafer Level Test and Burn-in with Initial FOX-XP and Integrated Automated WaferPak Aligner Order

FREMONT, Calif., Dec. 07, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor production test and reliability qualification equipment, today announced it ...
Seeking Alpha

Aehr Reports Record Quarterly Bookings Driven by Demand for Wafer Level Test and Burn-in of Semiconductors for Electric Vehicles

FREMONT, Calif., March 30, 2023 (GLOBE NEWSWIRE) -- Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced financial results for ...
Electronic Design

Semiconductor Test: Real-time adaptive test algorithm can safely reduce wafer testing time and cost

The testing of the semiconductor dies produced by a wafer fabrication plant involves a long series of operations requiring meticulous care. The time spent performing these tests markedly affects both ...
Electronics360

Three big semiconductor test probe challenges

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing ...